Application:
Yarn Evenness Tester is based on the platform of virtual instrument structure. Its a versatile and high performance testing instrument for the textile laboratory. It can be used to test evenness of yarns, roving, slivers which are spun with cotton, wool, flax and short synthetic fiber. It is very important for improving and assuring quality of yarns.
Features:
Imported electronic speed regulating system feature with accurate rotation speed and high test precision.
Zooming the currently unevenness curve in... View full description
Address: Fujian, Xiamen, Fujian, China
Phone: 86-595-22515221 - Fax: 86-595-22515221
Detailed Selling Lead Description
Application:
Yarn Evenness Tester is based on the platform of virtual instrument structure. Its a versatile and high performance testing instrument for the textile laboratory. It can be used to test evenness of yarns, roving, slivers which are spun with cotton, wool, flax and short synthetic fiber. It is very important for improving and assuring quality of yarns.
Features:
Imported electronic speed regulating system feature with accurate rotation speed and high test precision.
Zooming the currently unevenness curve in several proportion to facilitate the analysis of cycle uneven quality.
Storing the test resulting database to make it easy for user to carry out classified statistics and analysis with test result and enhance the quality control ability.
Statistic analyzing system can put out annals, seasonal report, monthly report, daily report of testing data for some material, and distribution diagram of index tendency.
Expert system (optical) can help user to analyze failures in the textile technology. It also can compare the yarn with USTER statistics.
Key Specification:
Measurement range: 4tex-80ktex
Testing speed: 4, 8, 25, 50, 100, 200, 400m/min
Testing times: freely setting between 0.5min --50min.
CV(%) or (U%) testing range: 0 ~ 99.99%
DR(%):testing range: 0~99.99%
Cut length and level: 1m, +5%,1m,-5%
Imperfects: It can put out twelve kinds of imperfect simultaneously.
Thin : -30%, -40%, -50%, -60%
Thick: +35%, +50%, +70%, +100%
Neps : +140%, +200%, +280%, +400%
Spectrogram: Spectrogram range: 1cm-3011m (86 channels);
Fine Spectrogram range: 1cm-3011m (172 channels);
Statistic/Index function: Statistic distribution diagram of common testing index. Statistic time can be set by unit of "day", "moth", "year".
Composition:
It consists of detector, host processor (including LCD monitor, keyboard, and mouse), laser printer, and yarn bracket.
TEL: 86 595-22515221
E-mail: beryl-wh@hotmail.com
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